REGMI, Dipendra; POUDEL, Mukti Ram; K.C., Bishwas; POUDEL, Padam Bahadur. Yield Stability of Different Elite Wheat Lines under Drought and Irrigated Environments using AMMI and GGE Biplots. International Journal of Applied Sciences and Biotechnology, [S. l.], v. 9, n. 2, p. 98–106, 2021. DOI: 10.3126/ijasbt.v9i2.38018. Disponível em: https://nepjol.info/index.php/IJASBT/article/view/38018. Acesso em: 30 jan. 2025.