Adhesion Force Measurement of Mica surface using AFM

Authors

  • Chetan Subedi Department of Physics, Prithiv Narayan Campus, Tribhuvan University
  • S K Lamichhane Department of Physics, Prithiv Narayan Campus, Tribhuvan University

DOI:

https://doi.org/10.3126/hj.v2i2.5218

Keywords:

AFM, Force distance curve, Nanoscale, Pull off force

Abstract

AFM is a tool to study the surface topography and associated molecular forces in real space image. AFM force-distance spectroscopy is the platform on which one can quantify atomic or molecular interactions and hence provide information that is critical to understand potential energy surface of mica through the measurement of pull-off force.

Keywords: AFM; Force distance curve; Nanoscale; Pull off force

The Himalayan Physics

Vol.2, No.2, May, 2011

Page: 71-72

Uploaded Date: 1 August, 2011

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Published

2011-07-31

How to Cite

Subedi, C., & Lamichhane, S. K. (2011). Adhesion Force Measurement of Mica surface using AFM. Himalayan Physics, 2(2), 71–72. https://doi.org/10.3126/hj.v2i2.5218

Issue

Vol. 2 (2011)

Section

Articles

License

The articles published in the Himalayan Physics are distributed under a license CC BY-NC-SA 4.0.